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PCN Number:20190403000PCN Date:June 11, 2019Title:Selective Roughened to Single-side Roughened LeadframePCN ManagerCustomer Contact:Dept:Quality ServicesEstimatedSampleDateprovidedatProposed 1st Ship Date: December 11, 2019Availability:sample requestChange Type:Assembly SiteDesignWafer Bump SiteAssembly ProcessData SheetWafer Bump MaterialAssembly MaterialsPart number changeWafer Bump ProcessMechanical SpecificationTest SiteWafer Fab SitePacking/Shipping/LabelingTest ProcessWafer Fab MaterialsWafer Fab ProcessPCN DetailsDescription of Change:Texas Instruments Incorporated is announcing the qualification of Single-side Roughened Leadframeto replace Selective Roughened Leadframe on select ective RoughenedNo changeNo changeToSingle-side RoughenedNo changeNo changeReason for Change:Improve leadframe supplier delivery.Anticipated impact on Fit, Form, Function, Quality or Reliability (positive / negative):None.Changes to product identification resulting from this PCN:None.Product S301030AB2PZPRTexas Instruments, TPHDRTAS5414CTPHDRQ1TPIC8101DWTPIC8101DWRPCN 20190403000

Automotive New Product Qualification Summary(As per AEC-Q100 and JEDEC Guidelines)Product AttributesAttributesAutomotiveGrade LevelOperating TempRangeQBS PackageReference:QBS PackageReference:QBS 2035DWRG4Grade 1Grade 1Grade 1Grade 1-40 to 125 C-40 to 125 C-40 to 125 C-40 to 125 C-40 to 125 CASICSignal ChainInterfacePowerManagementASICSignal PLPDW12820483212820Qual Device:Qual Device:Qual ade 1Grade 1-40 to 125 CProduct FunctionWafer FabSupplierDie RevisionAssembly SitePackage TypePackageDesignatorBall/Lead Count- QBS: Qual By Similarity- Qual Device and SN0302035DWRG4and S1105082F4PLPR are qualified at LEVEL3-260C- Qual Device SN0508068PHPR is qualified at LEVEL4-260CGQualification ResultsData Displayed as: Number of lots / Total sample size / Total failedType#Test SpecMinLotQtySS/LotTestName 5082F1PLPRP1105082F1PLPR /P1105082F3PLPQBS PackageReference:SN0302035DWRG4Test Group A – Accelerated Environment Stress TestsPCA1PCA1PCA1HASTA2ACA3TCA4JEDEC JSTD-020JESD22A113JEDEC JSTD-020JESD22A113JEDEC l 3260C----No Fails-Level 2260C---No Fails--Level 3260C-----No Fails96Hours----3/231/0-377377377377Autoclave ---3/228/0Texas Instruments, Inc.PCN 20190403000

TypeTCTC#Test SpecA4A4JESD22A104 andAppendix3JEDECJESD22A104 andAppendix3JEDECJESD22A104 andAppendix3MinLotQtySS/LottureCycle, Cycles-3/231/03/231/0-77TemperatureCycle, 883Method2011330TCWBSA4330PTA5145Texas Instruments, Inc.SN0302035DWRG4QBS F4PLPRP1105082F1PLPRP1105082F1PLPR ackageReference:TemperatureCycle, 65/150CMILSTD883Method2011TCWBPTestName /ConditionQualDevice:BondPull overBall PostT/C1000CyclesBondPull overBall PostT/C 500CyclesBondPull overStitchPost T/C1000CyclesBondPull overStitchPost T/C500CyclesWireBondShear,Post T/C500CyclesWireBondShear,Post T/C1000CyclesPower3/90/0PCN 20190403000

Type#Test 2B100 andB108310SBSC5AECQ100-010350Texas Instruments, Inc.TestName geReference:LP8860AQVFPRQ1TemperaCyclestureCycle, 40/125CHighTemp500StorageHoursBake175CTest Group B – Accelerated Lifetime Simulation TestsLife1073Test,Hrs125CEarlyLifeFailure72 HrRate,125CNVMEndurance, DataRetentioN/AN/AN/AN/An, andOperational LifeTest Group C – Package Assembly Integrity k 1.67)WireBondPullWires3/90/03/90/03/90/03/90/0(Cpk 1.67)SolderabilityPhysicalDimensions(Cpk 1.67)SolderBallShear(Cpk LPR /P1105082F3PLPQBS 0/03/30/0-3/30/0SolderBallsN/AN/AN/AN/AN/AN/APCN 20190403000

Type#Test ySS/LotTestName ESD61--TDDBD2JESD35--HCID3JESD60& 28--NBTID4---SMD5---Texas Instruments, -----------SN0508068PHPRTest Group D – Die Fabrication Reliability TestsComplComplet Compleeteded Perted PerPerProcessProcess ProcesElectromTechnol TechnolsigrationogyogyTechnRequire RequireologymentsmentsRequirementsComplTimeComplet CompleetedDependaed Perted PerPerntProcessProcess ProcesDielectriTechnol TechnolscogyogyTechnBreakdoRequire RequireologywnmentsmentsRequirementsComplComplet Compleeteded Perted PerPerHotProcessProcess ProcesInjectionTechnol TechnolsCarrierogyogyTechnRequire RequireologymentsmentsRequirementsComplComplet CompleetedNegativeed Perted PerPerBiasProcessProcess ProcesTemperatTechnol TechnolsureogyogyTechnInstabilitRequire RequireologyymentsmentsRequirementsComplet Comple Compled Perted PeretedStressProcessProcessPerMigratioTechnol Technol ProcesnogyogysRequire Require 105082F1PLPR /P1105082F3PLPPCN 20190403000QBS PackageReference:SN0302035DWRG4

Type#Test SpecMinLotQtySS/LotTestName lDistributionsCpk 1.67Room,hot, andcold test-E5AECQ100-0093SN0508068PHPRRequirementsTest Group E – Electrical Verification TestsESD HBM 2000 VQ100ESD CDM 750 LPR /P1105082F3PLPQBS /0----1/90/0-Additional alIntegritySequenceThermalIntegritySequenceLevel 3260C-3/36/0---3/36/0Level 3260C3/36/0---3/36/0-Level 4260C--3/36/0---A1 (PC): Preconditioning:Performed for THB, Biased HAST, AC, uHAST, TC & PTC samples, as applicable.Ambient Operating Temperature by Automotive Grade Level:Grade 0 (or E): -40 C to 150 CGrade 1 (or Q): -40 C to 125 CGrade 2 (or T): -40 C to 105 CGrade 3 (or I) : -40 C to 85 CE1 (TEST): Electrical test temperatures of Qual samples (High temperature according to Grade level):Room/Hot/Cold : HTOL, EDRoom/Hot : THB / HAST, TC / PTC, HTSL, ELFR, ESD & LURoom : AC/uHASTGreen/Pb-free Status:Qualified Pb-Free(SMT) and GreenFor questions regarding this notice, e-mails can be sent to the contacts shown below or yourlocal Field Sales [email protected] PacificWW PCN TeamPCN ww admin [email protected] Instruments, Inc.PCN 20190403000

Texas Instruments, Inc.PCN 20190403000